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Analog signal
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831	1. ASSIGNED PROJECT NUMBER[removed]TITLE OF DOCUMENT IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std[removed]for Analog and Mixed Signal Environments 7. WORKING GROUP INFORMATION: Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-11-29 11:58:17 Analog signal Electronic design Video signal Digital VHDL-AMS Verilog-A Electronic engineering Electronics Hardware description languages
832	Minutes of 1241 Standards Committee Meeting in Tucson, Arizona USA – February 19, 2009 Minutes Prepared by: Solomon Max – 2005-March-12 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2009-03-18 16:42:16 Electronics Electromagnetism Analog-to-digital converter Spurious-free dynamic range Flash ADC Sampling Digital signal processing Electronic circuits Electronic engineering
833	P1658 Digital to Analog Standard Meeting, February 21, 2008 Attendees: Steve Tilden, Texas Instruments (Chair) [removed] Robert Graham, Sandia National Labs., Albuquerque, NM USA [removed] Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-03-03 15:23:27 Electronic engineering Digital-to-analog converter Analog-to-digital converter Sampling Spurious-free dynamic range Differential nonlinearity Quantization error Effective number of bits Signal-to-noise ratio Digital signal processing Electronics Electromagnetism
834	MULTI-PROTOCOL USB An All-Serial Data Acquisition System – No Microcontroller Required! Plus – Using FFT’s to Whistle your Way to Home Automation Don L. Powrie Introduction The vast majority of USB devices avai Add to Reading List Source URL: www.dlpdesign.com Language: English - Date: 2011-12-11 18:56:42 Digital signal processing Electronic circuits Microcontrollers Universal Serial Bus Analog-to-digital converter RS-232 Sound card USB flash drive Serial port Computer hardware Electronics Electronic engineering
835	Section 13 – Scope of proposed project. The project develops Analog Boundary Scan Description Language (ABSDL), to describe the boundary scan implementation in a mixed-signal device conforming to IEEE[removed]A Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:21:38 Boundary scan description language Boundary scan Business Joint Test Action Group Institute of Electrical and Electronics Engineers Electronics manufacturing Technology Engineering
836	Minutes of March 17, 2004 TC-10 Meeting in Boulder, Colorado Draft Standard for Terminology and Test Methods for Digital to Analog Converters Attendance: Steve Tilden Tom Linnenbrink Bill Boyer Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2004-04-27 12:19:28 Technology Digital-to-analog converter Spurious-free dynamic range Signal generator Differential nonlinearity Effective number of bits Integral nonlinearity Digital signal processing Electronics Electromagnetism
837	Minutes of February 15, 2004 TC-10 Meeting in Tucson, Arizona (Rev 03-Apr[removed]Draft Standard for Terminology and Test Methods for Digital to Analog Converters Attendance: Steve Tilden Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-04-03 11:57:41 Digital signal processing Electronic circuits Audio electronics Total harmonic distortion Digital-to-analog converter Sound Distortion SINAD Signal-to-noise ratio Electronics Electromagnetism Signal processing
838	[removed]P1658 Minutes Saturday, March 10, 2007 1 Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-03-10 19:32:35 Digital signal processing Electronic circuits Noise Jitter Synchronization Oscillators Digital-to-analog converter Sampling Analog-to-digital converter Electronics Electromagnetism Electronic engineering
839	IEEE-STD-1658 DAC STANDARDS WORKING COMMITTEE LTX-Credence Milpitas, CA USA 27 October 2010, 9:00 – 17:00 Attendees: Steve Tilden Sol Max Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2010-11-08 09:41:01 Electronic engineering Spurious-free dynamic range Digital-to-analog converter Reconstruction filter Zero-order hold Modulation Noise Digital signal processing Electronics Electromagnetism
840	1241 Analog to Digital Standard Meeting, September 24, 2008 Modified – November 7, 2008 Location: Florence, (Italy) Attendees: Tom Linnenbrink, Hittite, (Chair, TC-10) [removed] Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2008-11-07 15:25:47 SINAD SHA Solomon Tilden Technology Hebrew Bible Old Testament Digital signal processing Analog-to-digital converter Spurious-free dynamic range

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